SEM low profile 70 deg. specimen mount, pin mount Pack Size:Each PEEK does not adhere to

PEEK does not adhere to most resins

or thermally cured epoxies

Designed for use with PELCO Vacuum Chamber

contained device comprises piezoelectric crystals and a compression trigger mechanism to create a steady stream of ions from the tip

SEM low profile 70 deg. specimen mount, pin mount Pack Size:Each PEEK does not adhere toThe SEM low profile 70 specimen mount is cut to allow advantageous specimen observation when using low working distance. Ideal for electron backscatter diffraction (EBSD) analysis. Made of aluminium with a machine grooved edge, 3. 2mm diameter pin. Compatible with FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs. Size: 12. 7mm diameter x 9. 5mm pin height